May 28th, 2014 – TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for the TEM new users with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 2 hours theory component (taught by Prof. James LeBeau) on Wednesday Morning (8:30 am to 10:30 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic Diffraction and Imaging.
  3. Introduction of the advanced characterization techniques.

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

Date Wednesday, May 28th, 2014
Time 8:30 am – 5:00 PM
Location Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $150; industry $350

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu.

Course limited to 10 people.

Mar. 28th, 2014 – XRD Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component (taught by Assoc. Prof. Jacob Jones), 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S prior to March 28 (see details at http://www.aif.ncsu.edu/becoming-a-user/ for this information and other requirements to gain future access to the instruments).

Date Friday, March 28th, 2014
Time 8:30 am – 4:00 PM
Location 463 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $150; industry $350

 

For more details and to register, please contact Prof. Jacob Jones at his email JacobJones@ncsu.edu

Course limited to 10 people.

Example of XRD data: XRD example

Feb. 14th, 2014 – SEM Short Course

SEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on Scanning Electron Microscopy (SEM). There will be two hours of lecture and each student will gain an hour of hands-on time running a variable pressure Hitachi S-3200N SEM.  The goal of the course is to provide students with enough theory and practical knowledge that they are operating the VPSEM without any assistance by the end of the day. To insure each student receives a maximum of time on the SEM, the course will be limited to 6 participants.

Date Friday, February 14th, 2014
Time 8:00 am – 5:00 pm
Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $120; non-profit $240; industry $350

 

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.