NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component (taught by Assoc. Prof. Jacob Jones), 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.
In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S prior to March 28 (see details at http://www.aif.ncsu.edu/becoming-a-user/ for this information and other requirements to gain future access to the instruments).
||Friday, March 28th, 2014
||8:30 am – 4:00 PM
||463 Monteith Research Center, Centennial Campus of North Carolina State University
||NCSU student $50; non-profit $150; industry $350
For more details and to register, please contact Prof. Jacob Jones at his email JacobJones@ncsu.edu
Course limited to 10 people.
Example of XRD data: XRD example
SEM Short Course
NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on Scanning Electron Microscopy (SEM). There will be two hours of lecture and each student will gain an hour of hands-on time running a variable pressure Hitachi S-3200N SEM. The goal of the course is to provide students with enough theory and practical knowledge that they are operating the VPSEM without any assistance by the end of the day. To insure each student receives a maximum of time on the SEM, the course will be limited to 6 participants.
||Friday, February 14th, 2014
||8:00 am – 5:00 pm
||318 Monteith Research Center, Centennial Campus of North Carolina State University
||NCSU student $120; non-profit $240; industry $350
For more details and to register, please contact Chuck Mooney at firstname.lastname@example.org.
Please join us to congratulate Kun Fu from College of Textile, and (Joseph) Houston Dycus from Materials and Science Engineering to receive AIF 2013 best paper award. Their research work involves employing many analytical instruments housed at AIF.
Aligned carbon nanotube-silicon sheets: A novel nano-architecture for flexible lithium ion battery electrodes
PI: Philip Bradford
First author: Kun Fu
Quote from the manuscript: “Characterization: The morphologies of the samples were investigated using a field emission scanning electron microscope (FE-SEM, JEOL 6400F) and transmission electron microscope (TEM, HITACHI HF2000, accelerating voltage 200 kV). The crystallographic and chemical structures were studied using wide angle X-ray diffraction (WAXD, Rigaku Smartlab) and a Renishaw Raman microscope (514 nm). Compositions of samples were examined by variable pressure scanning electron microscope (VPSEM) equipped with energy-dispersive X-ray spectroscopy (EDS).”
Atomic scale structure and chemistry of Bi2Te3/GaAs interfaces grown by metallorganic van der Waals epitaxy
Applied Physics Letters
PI: Jim LeBeau
First author: (Joseph) Houston Dycus
Quote from the manuscript: “In this Letter, an aberration corrected scanning transmission electron microscope equipped with a state-of-the-art energy dispersive x-ray spectrometer is used to analyze the structure and chemistry of the interface between Bi2Te3 grown by metallorganic chemical vapor deposition (MOCVD) on GaAs substrates.”