Sep. 25th, 2015 – FIB Short Course

FIB short course

AIF is going to offer another FIB short course in June 26th, 2015. The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 6 participants.

Date Friday, Sep 25th 2015
Time 8:30 am – 5:30 pm
Location 324 Monteith Research Center, NCSU Centennial Campus
Registration cost (student and non-profit) $50
Registration cost (industry) $350

 

For more details and to register, please contact Fred Stevie at fred_stevie@ncsu.edu.

Sep 15th, 2015 – TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for the TEM new users with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 2 hours theory component on Morning (9:00 am to 10:30 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic Diffraction and Imaging.
  3. Introduction of the advanced characterization techniques.

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

 

Date Tuesday, Sep 15th, 2015
Time 9:00 am – 5:00 PM
Location Lab: Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University (Lecture location is to be determined)
Cost NCSU student $50; non-profit $50; industry $350

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu.

Sep. 18th and Oct 2nd, 2015 – SEM Short Course

SEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory, each student will get hands-on time (90 minute or more per student) running the AIF variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic understanding of both theory and practice such that they can operate any SEM with minimal training.  By the end of the day, the students should be able to operate the VPSEM without assistance. To insure each student receives maximum hands-on time, the course will be limited to 3 participants.

Date Friday, Sep 18th and Oct 2nd, 2015
Time 8:00 am – 5:00 pm
Location 318 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $50; industry $350

 

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.