May 28th, 2015 – XRD Specialized Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a XRD short course specialized in advanced X-ray analysis methods using Eulerian Cradle, and in situ XRD measurements using non-ambient stages. These advanced characterization techniques are very useful to investigate thin film/crystal quality, orientation relation between film and substrate, texture, thermal expansion, crystallization reactions, and phase transition studies. The course will include 1.5 hour theory component (taught by Dr. Ching-Chang Chung) on Thursday Morning (9 am to 10:30 am), and the rest of the day will be in the XRD lab.

This short course will cover the following topics:

  1. Introduction of different characterization techniques using an Eulerian Cradle. This includes Rocking Curve, Reciprocal Space Mapping, Phi Scan, and Pole Figure measurements.
  2. Introduction of in situ XRD measurements using non-ambient stages.
  3. Lab Sessions

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do advanced X-ray analysis methods using an Eulerian Cradle and different non-ambient stages, and how to optimize/design their own experiments for their projects.

 

Date Thursday, May 28th, 2015
Time 9:00 am – 5:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $150; industry $350

 

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu

Course limited to 10 people.

 

May 27th, 2015 – TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal orientation and phase information of materials, as well as the chemical distribution down to atomic resolution. It is meant for the TEM new users with interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 2 hours theory component on Wednesday (May 27th) Morning (8:30 am to 10:30 am), and the rest of the day will be laboratories.

This introductory course will cover the following topics:

  1. Basic principles of TEM.
  2. Basic Diffraction and Imaging.
  3. Introduction of the advanced characterization techniques.

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM, and what information the advanced TEM techniques can provide, as well as how to design their own experiments for their projects.

 

Date Wednesday, May 27th, 2015
Time 8:30 am – 5:00 PM
Location Room 1046, Engineering Building 1, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $150; industry $350

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu.

May 18th, 2015 – XRD Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano geometry (that typically used for powders), and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component (taught by Assoc. Prof. Jacob Jones), 1 hour of phase identification training in the AIF Data Analysis center, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety, attendees will be able to independently operate a diffractometer in basic mode.

In order to facilitate authorization to use the equipment, participants are encouraged to take the Analytical X-ray Safety offered by EH&S prior to May 18 (see details at http://www.aif.ncsu.edu/becoming-a-user/ for this information and other requirements to gain future access to the instruments).

Date Monday, May 18th, 2015
Time 8:30 am – 4:00 PM
Location 324 Monteith Research Center, Centennial Campus of North Carolina State University
Cost NCSU student $50; non-profit $150; industry $350

 

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu

Course limited to 10 people.

Example of XRD data: XRD example