On April 29, 2015, Elaine Zhou from the Analytical Instrumentation Facility was recognized through an Award for Excellence nomination within the College of Engineering for her contributions in the area of innovation in materials characterization services. Elaine has made significant contributions to improve the effectiveness of innovative services offered by the College to internal and external customers, which has resulted in several new and improved innovations. In particular, Elaine has been instrumental in transcending and integrating disciplines to exploiting tools and instrumentation that lies at the interface of disciplines. She has presented several seminars on new techniques to many groups at NC State, at the University of North Carolina at Chapel Hill, and in presentations at national and international meetings. Her work has significantly increased the usage and visibility of the materials characterization tools to the academic community and industry.
The NCSU Analytical Instrumentation Facility (AIF) opened its doors to group of visiting middle- and high-school students and educators on April 24. As part of Nanodays 2015, professors and graduate students from the Department of Materials Science and Engineering and AIF staff members introduced these guests to state-of-the-art instrumentation used to image materials at the nanometer length scale. A highlight of the afternoon included demonstrations on the extreme resolution scanning electron microscope, focused ion beam and Titan STEM. Coordinated by the NCSU Science, Technology, Engineering and Mathematics Education, Nanodays annually attracts over 2000 top middle- and high- school science students, educators and parents across North Carolina to learn about cutting-edge nanoscience and nanotechnology research and applications.
FIB short course
AIF is going to offer another FIB short course in June 26th, 2015. The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 6 participants.
|Date||Friday, June 26th 2015|
|Time||8:30 am – 5:30 pm|
|Location||324 Monteith Research Center, NCSU Centennial Campus|
|Registration cost (student and non-profit)||$50|
|Registration cost (industry)||$350|
For more details and to register, please contact Fred Stevie at email@example.com.