Please join us to congratulate Golsa Naderi, a recent graduate student in Prof. Justin Schwartz’s group for her recently published paper in Superconductor Science and Technology. They acknowledged the use of AIF equipments including FEI Quanta Focused Ion Beam (FIB) and FEI Titan 80-300 Aberration Corrected STEM with SuperX EDS.
FIB short course
Due to the larger number of requests for AIF last FIB short course, we are going to offer another FIB short course in Jan 16th, 2015. The FIB short course includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 6 participants.
||Friday, Jan 16th 2015
||8:30 am – 5:30 pm
||324 Monteith Research Center, NCSU Centennial Campus
|Registration cost (student)
|Registration cost (industry)
For more details and to register, please contact Fred Stevie at firstname.lastname@example.org.
Please join us to congratulate Sarah E. Atanasov from Greg Parsons group in Chemical and Biomolecular Engineering, and Nacole King from Paul Maggard in Chemistry to receive AIF 2014 best paper award. Their research work involves employing many analytical instruments housed at AIF.
Improved cut-resistance of Kevlar® using controlled interface reactions during atomic layer deposition of ultrathin (<50 Å) inorganic coatings
Journal of Materials Chemistry A
PI: Gregory Parsons
First author: Sarah E. Atanasov
Quote from the manuscript: “A SPECS X-ray photoelectron spectrometry system with Al anode and PHOIBOS 150 analyzer provided elemental analysis of the PPTA substrate……… Transmission electron microscopy (TEM) (Hitachi HF2000) and scanning electron microscopy (SEM) (Phenom) were used to image PPTA yarn cross-sections and surface deformation, respectively……. The authors acknowledge R. Garcia and F. Stevie at the Analytical Instrumentation Facility (AIF) for assistance with TEM and XPS analysis, respectively.”
Copper Deficiency in the p-Type Semiconductor Cu1-xNb3O8
Chemistry of Materials
PI: Paul A. Maggard
First author: Nacole King
Quote from the manuscript: “The Cu1−xNb3O8 powders (reaction FS1) were fixed onto double-sided carbon tape, and a single crystallite was selected to make the TEM sample. An FEI Quanta 3D Dual Beam Scanning Electron Microscope (SEM) with focused ion beam (FIB) was used to prepare the TEM sample………. Atomic resolution images were taken using an FEI Titan 80-300 probe aberration corrected and monochromated scanning transmission electron microscope (S/TEM) operated at 200 kV.”